This course is designed for undergraduates in the field of electronic science and engineering. It describes the testing principles and test methods of semiconductor devices, as well as methods for extracting important parameters of semiconductor devices, such as p-n junctions, MOS capacitors, and MOSFETs.Through the obtained parameters of the semiconductor device, the performance of the semiconductor device is reasonably evaluated, and the basic principles and ideas in the process of testing and evaluating the semiconductor device are grasped.